At the core of all advanced SEMICON & EMS AOI lies Synthia AI Suite,which powers advanced 2D+3D inspection, smart programming, and vision intelligence in one unified AOI platform.
6DF enables comprehensive 6-sided AOI inspection, covering the top, bottom, left, right, front, and rear surfaces of a product in a single inspection workflow.
This allows manufacturers to inspect not only the main board surface, but also side-mounted components, connectors, solder joints, labels, screws, ports, cables, mechanical parts, and hidden assembly areas that are often missed by conventional top-view inspection systems.
Final Assembly & Functional Module
LED, Sensor & Automotive Board
Through-hole & Mix Assemblies
Press-fit & Connector Assemblies
Provide comprehensive inspection coverage across a wide range of assembly processes:
Core Vision Module That Empowers 6DF
NV6 Pro
High-speed gantry-based AOI system designed for final-stage electronics inspection.
Auto-generated scanning paths from CAD files for faster setup compared to traditional robot arm systems.
6 vision station modules with 2D+3D capability for multi-angle inspection.
Simultaneous all-side image capture to improve inspection speed and reduce cycle time.
Angled cameras help detect defects that are difficult to identify from top-view inspection alone.
Multi-color directional lighting improves contrast and image clarity for accurate defect analysis.
3D structured light system enables measurement of height variation, warping, surface deformation, and dimensional defects.
Single-pass inspection capability combines 2D visual inspection and 3D measurement in one efficient scan.
Future-Proofing Quality Assurance Through 6DF Empowered 2D+3D Vision Technologies
SYNTHIA
Meet 3DF
Advanced 2D + 3D AOI for EMS Industry
3DF delivers exceptional performance through dual 3D methodologies, enabling reliable inspection of densely populated assemblies, complex geometries, and challenging surfaces, including highly reflective and low-contrast materials.
Comprehensive inspection coverage across a wide range of assembly processes:
Surface Mount Technology (SMT) Assemblies
Through-Hole and Mixed Assemblies
Chip-on-Board (COB) and Die-on-Board Applications
Flip-Chip and Advanced Semiconductor Modules
LED, Sensor, and Automotive Boards
Press-fit and Connector Assemblies
Final Assembly and Functional Module Inspection
Future-Proofing Quality Assurance Through 6DF Empowered 2D+3D Vision Technologies
Pre & Post-Reflow Photonics Transceiver Packaging
AI-powered detection for missing components and offsets.
Delivers ultra-precise 3D coplanarity inspection on reflective flip chip surfaces.
Detects microscopic foreign particles in the background.
Applies ultra-smart AI for wire segmentation on low contrast surfaces.
Wirebond
Broken/Damaged Wire
Bond Offset
Die Chip
Wirebond
Specifically for wirebond quality using 2D and 3D inspection, targeting stack-dies wirebond and multi-dies wirebond devices such as Memory and ASIC.
Wirebond defects including broken wires, lifted bonds, NSOP, short, loop deformities, wire sway, loop height, bond ball size, etc.